Semiconductor Test & Measurement Solutions

Expand Test Capability Without Expanding System Complexity

Fast, galvanically isolated MEMS switching helps you reconfigure signal paths, protect sensitive measurements, and improve throughput across semiconductor test applications.

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Select Your Test Application

Choose an application below to explore its performance and design benefits.

Avoid Costly Testing Delays and Downtime

When unreliable testing results lead to increased downtime, wasted resources, and compromised product quality, can you afford to overlook the impact on your bottom line?

  • High cost of test limits your efficiency
  • Existing relays slow down your operations
  • Heat management complicates your designs
  • Frequent replacements disrupt your testing schedule
Probe card contacting a semiconductor wafer during high speed semiconductor test and measurement using advanced switching architecture.
  • Bulky components occupy valuable board space
  • Low switch lifetime increases total expenses
  • Incompatibility with standard digital interfaces slows integration
  • Limited testing capacity affects your throughput
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Automated semiconductor test systems operating at scale with advanced switching architecture to reduce cost per test and improve throughput.

Experience Faster, Reliable Testing

Cut costs and time with Cenfire's CF2140 MEMS Switch

  • Switching speeds 4x faster than traditional technologies.
  • Reduce board area by up to 40%.
  • Limit thermal management needs with low power draw.
  • Extend switch lifespan with superior reliability.
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We're Here to Help You Succeed

Trust Cenfire to provide innovative, scalable solutions.

  • High Density
  • Ultra-Fast
  • Scalable High-Voltage lower cost per test

Cenfire’s MEMS switches transformed our testing approach, delivering unmatched reliability and cost savings.

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Cenfire CF2140 silicon-based MEMS switch shown in a ceramic LGA package, offering engineers a compact, high-performance replacement for mechanical relays, reed relays, and PhotoMOS relays.

Cenfire CF2140 MEMS Switch

3 Simple Steps to Enhance Testing

Take control of your testing efficiency today.

STEP 1

Schedule a Discovery Call

Discuss your switching requirements with our experts.

STEP 2

Evaluate Our CF2140 Switch

Test our switch with a DC or RF evaluation board.

STEP 3

Design-In and Production

Move to full production and achieve faster testing and reduced costs.

Cut Testing Costs and Improve Reliability with Advanced MEMS Switching

In the world of test and measurement, engineers face a daunting challenge: balancing cost-efficiency with reliability as chip complexity increases. Cenfire recognizes this struggle and offers a transformative solution. Our MEMS switch outperforms traditional relays with lightning-fast switching and minimal power consumption, enabling you to optimize board area and eliminate unnecessary heat management. By seamlessly integrating digital I/O, our technology empowers you to achieve single-touchdown testing, effectively halving your total cost of ownership. Experience a 10-100x ROI, reduced downtime, and an unparalleled increase in testing efficiency. With Cenfire, you can confidently embrace innovation in your testing environments.

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