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Test Your Entire Device in a Single Touchdown

Run more test coverage in less time without increasing system complexity or cost.

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Faster test throughput

Run more tests in less time.

Lower cost of test

Reduce tester time and system overhead.

On-Board Switching

Enable faster, smaller switching architectures built on silicon

Test Systems Are Constrained by Legacy Switching Architecture

As semiconductor complexity increases, test requirements grow but switching architectures have not kept up. The result is a system that limits throughput, increases cost, and slows time to yield.

  • Each new test condition often requires another touchdown
  • Relays introduce delays that slow overall test time
  • Signal noise and settling impact measurement accuracy
  • Engineers are forced to design around switching limitations
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Probe card contacting a semiconductor wafer during high speed semiconductor test and measurement using advanced switching architecture.
Automated semiconductor test systems operating at scale with advanced switching architecture to reduce cost per test and improve throughput.

Reduce Cost of Test at Scale

Switching inefficiencies compound across every device tested.

Cenfire reduces cost by:

  • Minimizing tester time per device
  • Eliminating retest cycles
  • Reducing probe card wear and maintenance
  • Simplifying hardware and system design

The result is lower total cost of ownership and faster return on test infrastructure.

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Built on Silicon. Designed to Scale

Unlike alternative switching approaches, Cenfire is built on standard silicon manufacturing processes.

A solution engineered for deployment—not experimentation.

  • Scalable production
  • Consistent performance
  • Long-term reliability

The result is lower total cost of ownership and faster return on test infrastructure.

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Cenfire-MEMS-Switch

Build Faster, More Scalable Test Systems

A Simple Path to Evaluation and Integration

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STEP 1

Share Your Application

Tell us about your test architecture, switching requirements, and performance goals. Our engineering team will help determine the best approach for your system.

STEP 2

Validate Performance

Evaluate switching speed, signal integrity, and system integration within your existing load board, probe card, device interface board, or ATE environment.

STEP 3

Scale Into Production

Deploy a switching architecture designed to increase throughput, simplify system design, and support next-generation semiconductor test platforms.

Switching Inefficiencies Increase Tester Time, Add Complexity, and Drive Up Cost Across Every Device Tested.

The result is lower total cost of ownership and faster return on test infrastructure. Cenfire removes that overhead enabling faster testing, fewer retests, and lower total cost at scale.

TALK WITH OUR TEAM

Without Cenfire

  • Multiple touchdowns
  • Slower throughput
  • Higher cost per test
  • Increasing system complexity

With Cenfire

  • Single-touchdown testing
  • Faster yield ramp
  • Simplified architecture
  • Scalable test systems