SEMICONDUCTOR TEST SOLUTIONS
Get More Test Capability from Every Tester Resource.
Share valuable instruments across more DUT connections and test sites with fast, galvanically isolated signal routing. Improve multisite efficiency, expand tester capability, and lower cost of test without compromising measurement integrity.
ATE platforms must support an expanding range of DC, analog, mixed-signal, and RF measurements while efficiently allocating valuable tester resources across DUT pins and test sites. Separate or fixed switching architectures can limit instrument sharing, constrain multisite configurations, and increase the cost and complexity of supporting new devices.
The CF2140 integrates four independently controlled, galvanically isolated SPST switches in a compact 4 × 6 × 2 mm package. With signal capability from DC to 6 GHz, it enables ATE manufacturers to implement a common, configurable routing architecture across switching matrices, channel cards, instrumentation modules, and DUT-interface hardware.
Use the CF2140 to expand test capability, improve tester-resource utilization, preserve measurement integrity, and increase the responsiveness of automated test systems.
Route DC, analog, mixed-signal, and RF measurements through a common switching platform. Support a broader range of devices and test requirements without developing separate switching architectures for each instrument type.
True galvanic isolation, leakage below 1 nA at 50 V, and 0.2 pF typical open capacitance minimize the influence of inactive instruments, disconnected sites, and unused signal branches on the active measurement path.
Allocate valuable tester resources across more DUT pins and test sites instead of dedicating an instrument to every measurement path. Configure four independent channels as 4 × SPST, 2 × SPDT, or 1 × SP4T for instrument sharing, input selection, multiplexing, and calibration routing.
Reconfigure signal paths in less than 10 µs to reduce routing overhead during scanning, sequencing, calibration, characterization, and production test.
The CF2140 combines the true galvanic isolation of a mechanical relay with the speed, density, and digital control of a silicon switching platform.
Reduce routing delays during automated test sequences, channel scanning, instrument selection, and internal calibration.
Physically separate open signal paths with a silicon MEMS air gap, eliminating the continuous semiconductor path found in conventional solid-state switches.
Limit unwanted current through disconnected channels in high-impedance and low-current measurement paths where leakage directly affects the measurement error budget.
Reduce feedthrough, loading, and coupling through open channels to preserve separation between active instruments and inactive signal branches.
Design Around the Measurement
Combine less than 10 µs switching, true galvanic isolation, low leakage, and low open capacitance in one compact, digitally controlled device. Route DC, analog, mixed-signal, and RF measurements while simplifying drive circuitry and preserving valuable space, power, and thermal headroom within the test head or instrument cabinet.
Deliver More Capability per Tester
Differentiate your ATE platform by supporting DC, power, analog, mixed-signal, and RF routing through one configurable switching architecture. Expand measurement coverage, instrument sharing, and multisite flexibility without requiring a proportional increase in tester resources or system cost.
Standardize Across Tester Platforms
Use one compact switching component across multiple instruments, channel cards, and tester configurations. Consolidate four switches, digital control, and integrated MEMS actuation to reduce component count, simplify sourcing, and support fewer platform-specific designs.