Build Faster, More Capable Box Test Systems
The CF2140 helps increase test throughput, improve measurement integrity, and reduce the board space, drive circuitry, heat, and maintenance associated with mechanical relays.
Integrate compact, galvanically isolated switching directly into your test architecture to route instruments, isolate inactive paths, and reconfigure instrument-to-DUT connections in less than 10 µs.
A box test system is only as fast and reliable as the switching architecture connecting its instruments to the DUT. Relay actuation time, contact wear, limited hot-switching endurance, and maintenance requirements can constrain throughput and system availability.
The Cenfire CF2140 combines four galvanically isolated SPST channels with less than 10 µs switching, low off-state loading, and integrated digital control to improve instrument-to-DUT routing throughout the test sequence.
Use the CF2140 to expand test capability, preserve measurement integrity, improve test throughput, and reduce switching-related maintenance in the finished test platform
Route DC, analog, and RF signals from DC to 6 GHz through one switching architecture. Configure the CF2140 as 4 × SPST, 2 × SPDT, or 1 × SP4T for instrument selection, calibration routing, matrix crosspoints, and DUT-path isolation.
Reconfigure connections between instruments, calibration references, and DUT paths in less than 10 µs. Reduce signal-routing delays in automated test sequences and complete switching-intensive test flows faster.
True galvanic isolation, leakage below 1 nA at 50 V, and 0.2 pF typical open capacitance minimize the influence of disconnected instruments and inactive paths on sensitive measurements.
Increase switching endurance in repetitive and hot-switching applications while reducing the contact wear, preventive maintenance, and system downtime associated with mechanical relays.
Each CF2140 specification is designed to improve signal-routing speed, preserve measurement integrity, and simplify integration into high-performance box test systems.
Reduce routing delays when switching between instruments, DUT connections, test conditions, and calibration paths during automated test sequences.
Physically disconnect inactive instruments and signal branches from the DUT, eliminating the continuous semiconductor path present in conventional solid-state switches.
Minimize unwanted current from disconnected instrument branches when multiple measurement resources share the same switching network.
Reduce loading, feedthrough, and signal coupling from inactive branches in matrix, multiplexer, and shared-instrument architectures.
Improve Every Switched Measurement
Combine less than 10 µs switching, true galvanic isolation, low leakage, and low open capacitance in one digitally controlled device. Simplify instrument routing while preserving measurement integrity.
Differentiate System Performance
Increase test throughput, support a broader range of measurement applications, and improve switching reliability through one flexible switching architecture.
Consolidate Switching and Control
Replace multiple discrete switches and their supporting drive components with four independently controlled, galvanically isolated channels in one compact package.
Contact Cenfire to discuss your instrument-routing requirements, switching conditions, and opportunities to improve the performance and reliability of your next box test system.