TEST AND MEASUREMENT SOLUTIONS
Build More Capability into Every Instrument.
Support DC, analog, mixed-signal, and RF routing through one compact, galvanically isolated switching platform. Expand instrument functionality, improve measurement confidence, and simplify signal-path design across modular, rack-mounted, and benchtop test equipment.
Test instruments increasingly need to support more signal types, measurement modes, and routing configurations within the same platform. That flexibility can become difficult to implement when different paths require different switching technologies, control circuitry, and isolation strategies.
The Cenfire CF2140 integrates four independently controlled, galvanically isolated SPST channels with less than 10 µs switching, low open-path leakage, low open capacitance, and signal routing from DC to 6 GHz.
This gives instrument designers a common signal-routing building block for modular, rack-mounted, and benchtop systems.
Use one switching platform to support DC, analog, mixed-signal, and RF signal paths from DC to 6 GHz. Expand instrument functionality without developing separate switching architectures for each measurement domain.
True galvanic isolation, leakage below 1 nA at 50 V, and 0.2 pF typical open capacitance minimize the influence of inactive instruments, calibration paths, and unused signal branches on the active measurement.
Combine four switching channels, integrated high-voltage MEMS actuation, and standard 3.3 V digital control in one compact device. Reduce external drive circuitry and reuse a common signal-routing building block across modular, rack-mounted, and benchtop products.
Configure four independently controlled channels as 4 × SPST, 2 × SPDT, or 1 × SP4T for instrument selection, multiplexing, calibration routing, and DUT-path isolation.
Support signal routing from DC to 6 GHz through the same switching platform, reducing the need to develop separate switching architectures for different instrument types.
The CF2140 combines broadband signal routing, ultra-low off-state loading, true galvanic isolation, and fast digital control in a compact device designed for test instrumentation.
Route DC, analog, mixed-signal, and RF signals through one switching platform, enabling broader instrument functionality without requiring separate switching technologies for each measurement domain.
Minimize unwanted current through disconnected channels in high-impedance, low-current, and precision measurement applications.
Reduce loading, feedthrough, and coupling from inactive signal branches in multiplexer, matrix, and shared-instrument architectures.
Physically separate open signal paths with a silicon MEMS air gap, preventing inactive branches from maintaining a continuous semiconductor connection to the active measurement path.
Build a More Versatile and Accurate System
Route DC, analog, mixed-signal, and RF signals from DC to 6 GHz while preserving measurement accuracy with low leakage, low open capacitance, and true galvanic isolation. Simplify signal-path design with four independently controlled channels, integrated MEMS actuation, and standard 3.3 V digital control.
Deliver More Capability per Instrument
Differentiate your product portfolio by supporting more measurement modes, routing configurations, and applications within the same instrument platform. Expand functionality and measurement confidence without a proportional increase in hardware complexity or system cost.
Standardize Across Product Families
Use one compact switching device across multiple instruments and signal-routing architectures. Consolidate four switches, digital control, and integrated high-voltage MEMS actuation to reduce component count, simplify sourcing, and limit product-specific switch SKUs.